2012

Optimization of Optical Inspections Using Spectral Analysis, K. Ohliger, C. Kröhnert, C. Heinze, Kapitel in Quality Assurance, Editor: Prof. Dr. M. Savsar, ISBN 979-953-307-494-7, intech, in Druck

 

2011

A Novel Position and Shape Adaptive Initialization of Region-Based Active Contours in Noisy Images, K. Ohliger, T. Edeler, S. Hussmann, A. Mertins (in Proceedings IEEE International Conference on Signal & Image Processing Applications 2011)

Increasing the Parameter Robustness of Active Contours Using Image Data Driven Initializations, K. Ohliger, T. Edeler, S. Hussmann, A. Mertins (in Proceedings 19th EuropeanSignal Conference 2011 (EUSIPCO 2011))

 

2010

A Novel Approach of Initialising Region-Based Active Contours in Noisy Images by Means of Unimodality Analysis, K. Ohliger, T. Edeler, A.P. Condurache, A. Mertins (in Proceedings IEEE International Conference on Signal Processing 2010)

A Novel Approach of Initialising Region-Based Active Contours in Noisy Images by Means of Higher Order Statistics and Dissimilarity, K. Ohliger, T. Edeler, S. Hussmann, A.P. Condurache, A. Mertins (in Proceedings IEEE International Conference on Mechatronics and Automation 2010)

Illumination Invariant Measurement of Mechanical Dimensions Using a Multiple Segmentation Method, K. Ohliger, T. Edeler, S. Hussmann, A. Mertins (in Proceedings IEEE International Instrumentation and Measurement Technology Conference 2010)

Time-of-Flight Depth Image Denoising Using Prior Noise Information, T. Edeler, K. Ohliger, S. Hussmann, A. Mertins (in Proceedings IEEE International Conference on Signal Processing 2010)

A New Shift Estimation Algorithm for Barcode Super Resolution, T. Edeler, K. Ohliger, S. Hussmann, A. Mertins (in Proceedings IEEE International Conference on Signal Processing 2010)

 

2009 

Super resolution of time-of-flight depth images under consideration of spatially varying noise variance, T. Edeler, K. Ohliger, S. Hussmann, A. Mertins (in Proceedings IEEE International Conference on Image Processing 2009)

Automated ethernet-based test setup for long wave infrared camera analysis and algorithm evaluation, T. Edeler, K. Ohliger, S. Lawrenz, S. Hussmann (in Proceedings Optical Measurement Systems for Industrial Inspection VI, 2009)

 

 

 

Unterlagen zum Download

Bildverarbeitung